Title
Data Collection: Straining Graphene
Description (en)
doi: 10.1038/s41699-018-0069-z Diffraction patterns of monolayer graphene recorded at a Philips CM200 at an acceleration voltage of 80kV. Diffraction patterns were taken during a straining experiment and at different tilts. Additionally simulated diffraction patterns and atomic structure files of monolayer graphene with different contractions of the material.
Keywords (en)
Graphene, TEM, Diffraction, Straining