Titel
Electron-Beam Manipulation of Silicon Dopants in Graphene
Autor*in
Nicholas A. Pike
Centre for Materials Science and Nanotechnology, University of Oslo
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Abstract
The direct manipulation of individual atoms in materials using scanning probe microscopy has been a seminal achievement of nanotechnology. Recent advances in imaging resolution and sample stability have made scanning transmission electron microscopy a promising alternative for single-atom manipulation of covalently bound materials. Pioneering experiments using an atomically focused electron beam have demonstrated the directed movement of silicon atoms over a handful of sites within the graphene lattice. Here, we achieve a much greater degree of control, allowing us to precisely move silicon impurities along an extended path, circulating a single hexagon, or back and forth between the two graphene sublattices. Even with manual operation, our manipulation rate is already comparable to the state-of-the-art in any atomically precise technique. We further explore the influence of electron energy on the manipulation rate, supported by improved theoretical modeling taking into account the vibrations of atoms near the impurities, and implement feedback to detect manipulation events in real time. In addition to atomic-level engineering of its structure and properties, graphene also provides an excellent platform for refining the accuracy of quantitative models and for the development of automated manipulation.
Objekt-Typ
Sprache
Englisch [eng]
Persistent identifier
phaidra.univie.ac.at/o:930863
Erschienen in
Titel
Nano Letters
Band
18
Ausgabe
8
Publication
American Chemical Society
Fördergeber
Austrian Science Fund (FWF) — P 28322-N36
European Union (all programmes) — 756277-ATMEN
European Union (all programmes) — 336453-PICOMAT
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Erscheinungsdatum
2018
Zugänglichkeit
Rechte
Rechteangabe
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