Title
STEM images of Bi split vacancy in Si
Language
Not applicable
Description (en)
Scanning transmission electron microscopy raw images (32-bit TIF) of Bi split vacancy structures recorded at the ORNL Nion UltraSTEM200 operated at 160 keV.
Keywords (en)
scanning transmission electron microscopy, atomic resolution imaging, materials science, silicon, dopants
Author of the digital object
Toma Susi (University of Vienna)
Format
application/zip
Size
1.2 MB
Installation Guide (en)
Can be opened with any microscopy software that handles 32-bit TIFs, e.g. Image J.
Requirements for the Use of the Object (en)
ImageJ {link}https://imagej.net/Fiji/Downloads{/link}
Licence Selected
CC BY 4.0 International
ÖFOS 2012
Materials physics
ÖFOS 2012
Radiation physics
ÖFOS 2012
Electron microscopy
ÖFOS 2012
Condensed matter
Organization Association
Faculty of Physics > Physics of Nanostructured Materials
Details about the source
Digital or other source
Details about the Source (en)
Nion UltraSTEM200 operated at 160 keV
Time Coverage (en)
Location (en)
Citable links
Persistent identifier
https://phaidra.univie.ac.at/o:1208827
Content
Details
This object is in collection
Metadata
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Universitätsring 1, 1010 Wien | T
T +43-1-4277-0