Focused-probe 4D-STEM datasets of pristine monolayer graphene

doi:10.25365/phaidra.564

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Title (eng)

Data contributor

Toma Susi

Physik Nanostrukturierter Materialien

Description (eng)

Four-dimensional scanning transmission electron microscopy (4D-STEM) datasets of pristine monolayer graphene. Data recorded on the Dectris ARINA direct-electron detector installed on a Nion UltraSTEM 100 microscope operated at 60 keV in ultra-high vacuum and room temperature with a convergence semiangle 34 mrad focused electron probe. Raw Nion Swift data have been converted into calibrated py4DSTEM DataCube objects and stored as HDF5 files containing two real-space scan axes and two reciprocal-space scattering axes recording the convergent-beam electron diffraction (CBED) pattern at each scan position.

Keywords (eng)

scanning transmission electron microscopy4D-STEMgrapheneCBEDdirect-electron detection

Subject (eng)

ÖFOS 2012 -- 103042 -- Electron microscopy

Subject (eng)

ÖFOS 2012 -- 103018 -- Materials physics

Type (eng)

dataset

Language

[eng]

Persistent identifier

https://phaidra.univie.ac.at/o:2081765