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Title (en)
Si impurity manipulation in SWCNTs
Language
Not applicable
Description (en)
Supplementary open data for article "Electron-beam manipulation of silicon impurities in single-walled carbon nanotubes", containing: raw MAADF/STEM data of Si impurity manipulation in SWCNTs; dynamics observed at the impurity sites; and density functional theory molecular dynamics trajectories of the Si-C bond inversion (direct exchange) process.
Keywords (en)
atom manipulationscanning transmission electron microscopyatomic resolutionsingle-walled carbon nanotubes
Author of the digital object
Toma Susi  (University of Vienna)
09.04.2019
Format
32-bit TIF
Installation Guide (en)
ImageJ ({link}https://imagej.nih.gov/ij/download.html{/link})
ÖFOS 2012
Electron microscopy
ÖFOS 2012
Materials physics
ÖFOS 2012
Nanotechnology
Details about the source
Digital or other source
Object
Details about the Source (en)
Nion UltraSTEM100 ({link}https://physnano.univie.ac.at/equipment/nion-ultrastem/{/link})
Members (4)

Si impurity dynamics in SWCNTs

o:949532

09.04.2019