Abstract (eng)
This work deals with atomic diffusion in solids and the investigation thereof by scattering methods, specifically using X-ray photon correlation spectroscopy (XPCS). Contrary to conventional methods, such as investigating diffusion via the analysis of the depth-dependent concentration of radioactive isotopes diffused into the sample during annealing, XPCS is able to detect the single atomic jump from lattice site to lattice site.
Starting with a review of the concepts used for describing diffusion on a lattice it is demonstrated how to interpret the results of an XPCS experiment by the pair correlation function. To this end also the temporal evolution of the pair correlation function under the influence of short-range order is derived.
Different aspects of atomic diffusion are simulated and discussed for selected exemplary systems. Results from experiments on these systems are presented and promising directions of future research are proposed. As the technique of X-ray photon correlation spectroscopy with atomic resolution was developed and for the first time successfully performed in the frame of this work, a substantial point is dedicated to practical considerations and calculations concerning the experiment, such as the optimal experimental set-up, the evaluation of the data, and the expected statistical significance of the results.