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Title (eng)
AFM force-distance-curves of graphene
Description (eng)
The original data contains AFM force-distance-curves of graphene. The curves were acquired on samples of one of the following three categories: - Pristine - Irradiated (cleaned) - Irradiated (contaminated) All samples used "Graphenea Inc. Easy Transfer: Monolayer Graphene on Polymer Film" as a source material and were transferred onto custom SiN TEM chips produced by Silson (3x3 Array of 1 µm thick and 90 µm wide SiN Windows with circular perforations of 3 µm in diameter. SAMPLE 1 Electronic Lab Notebook sample ID: 1033 SAMPLE2 Electronic Lab Notebook sample ID: 1034 SAMPLE3 Electronic Lab Notebook sample ID: 1189 SAMPLE4 Electronic Lab Notebook sample ID: 1489 SAMPLE5 Electronic Lab Notebook sample ID: 1940 SAMPLE6 Electronic Lab Notebook sample ID: 1941 SAMPLE7 Electronic Lab Notebook sample ID: 1942 SAMPLE8 Electronic Lab Notebook sample ID: 1617 SAMPLE9 Electronic Lab Notebook sample ID: 1619
Keywords (eng)
Atomic Force MicroscopynanoindentationGraphene
Subject (eng)
ÖFOS 2012 -- 103 -- Physics, Astronomy
Type (eng)
Language
English [eng]
Persistent identifier
https://phaidra.univie.ac.at/o:2125106
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Format
application/x-zip-compressed
Created
09.04.2025 04:12:39
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