Title (eng)
Original Data "Automated image acquisition and analysis of graphene and hBN from pristine to highly defective and amorphous structures"
Author
Description (eng)
This collection contains the raw data for the publication "Automated image acquisition and analysis of graphene and hBN from pristine to highly defective and amorphous structures".
The data contains semi-automatically collected ADF STEM images ("ScanMaps") and code for their analysis.
There is a more detailed description for each item.
Keywords (eng)
graphenehexagonal boron nitideelectron microscopydefects
Subject (eng)
ÖFOS 2012 -- 103042 -- Electron microscopy
Persistent identifier
Association (eng)
highly defective regime hBN
o:2074053
28.06.2024
non irradiated hBN
o:2074055
28.06.2024
medium defective regime hBN
o:2074048
28.06.2024
highly defective regime graphene
o:2076754
05.07.2024
medium defective regime graphene
o:2076753
05.07.2024
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https://phaidra.univie.ac.at/o:2074043 - Content
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